ChengDu, China

Le Yang

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Sichuan University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Le Yang. Retrieved from https://idiyas.com/inventor/le-yang-5lpn7sk8

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Le Yang: Innovator in Surface Defect Analysis

Introduction

Le Yang is a prominent inventor based in Chengdu City, China. He has made significant contributions to the field of surface defect analysis, particularly in the leather industry. His innovative approach combines advanced technology with practical applications, showcasing his expertise and dedication to improving industry standards.

Latest Patents

Le Yang holds a patent for an "Automatic Calculation Method for Surface Defect Area of Wet Blue Skin Based on DeepLabV3+ Model." This patent reflects his commitment to enhancing the efficiency and accuracy of defect detection in leather processing. With 1 patent to his name, he continues to push the boundaries of innovation in his field.

Career Highlights

Le Yang is affiliated with Sichuan University, where he contributes to research and development in various technological applications. His work not only benefits the academic community but also has practical implications for industries reliant on high-quality leather products.

Collaborations

Le Yang collaborates with esteemed colleagues such as Wei Lin and Changping Huang. Their combined expertise fosters a dynamic research environment that encourages innovation and the sharing of ideas.

Conclusion

Le Yang's contributions to the field of surface defect analysis exemplify the impact of innovative thinking in industry applications. His work at Sichuan University and his patent demonstrate his commitment to advancing technology in leather processing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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