This inventor holds 1 USPTO granted patent. Top assignee: New Holland North America, Inc.. Active years: 2000.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2000
Title: The Innovations of Lawrence Zierhut
Introduction
Lawrence Zierhut is an accomplished inventor based in Burnsville, MN (US). He has made significant contributions to the field of measurement technology, particularly in the area of grain flow measurement. His innovative approach has led to the development of a unique antenna unit that utilizes the Doppler effect for precise measurements.
Latest Patents
Zierhut holds a patent for an "Antenna unit for the Doppler measurement of grain flow." This invention is designed to measure the velocity of flowing materials in confined spaces. The antenna unit features a support block with two surfaces positioned at an acute angle, optimally 45 degrees. A printed circuit antenna card with a high-gain phased array is mounted on the second surface, radiating microwave energy towards the first surface. The design includes a plate that absorbs radiated energy and a recess for an absorber wedge, which shapes the radiation pattern to ensure accurate measurements.
Career Highlights
Zierhut is currently employed at New Holland North America, Inc., where he continues to innovate in the field of agricultural technology. His work has been instrumental in enhancing the efficiency of grain flow measurement systems.
Collaborations
Throughout his career, Zierhut has collaborated with notable colleagues, including George F. Nelson and Ray E. Artz. These partnerships have contributed to the advancement of technology in their respective fields.
Conclusion
Lawrence Zierhut's contributions to measurement technology, particularly through his patented antenna unit, demonstrate his commitment to innovation. His work at New Holland North America, Inc. and collaborations with esteemed colleagues further highlight his impact on the industry.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
