Cupertino, CA, United States of America

Lawrence D Wiebe

This inventor holds 1 USPTO granted patent. Top assignee: Hewlett-Packard Development Company, L.p.. Active years: 2005.


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2005

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1 patent (USPTO):Explore Patents

Title: Innovations of Lawrence D Wiebe

Introduction

Lawrence D Wiebe is a notable inventor based in Cupertino, CA (US). He has made significant contributions to the field of electronic systems through his innovative patent. His work focuses on enhancing the availability assessment of complex electronic systems, including computer systems.

Latest Patents

Lawrence D Wiebe holds a patent titled "Method and system for assessing availability of complex electronic systems, including computer systems." This patent describes a semi-automated availability-assessment system and methodology. The system utilizes a comprehensive questionnaire that gathers detailed information about hardware, operating-system components, application-and-database-software components, and potential sources of downtime. The information is processed through several steps to conduct a Markov-chain availability analysis, ultimately producing a final availability assessment for the system. He has 1 patent to his name.

Career Highlights

Lawrence D Wiebe is associated with Hewlett-Packard Development Company, L.P., where he has contributed to various projects and innovations. His expertise in assessing the availability of electronic systems has positioned him as a valuable asset in the technology sector.

Collaborations

Some of his notable coworkers include William M Gray and Curtis P Kolovson. Their collaboration has likely contributed to the advancements in the projects they have worked on together.

Conclusion

Lawrence D Wiebe's innovative approach to assessing the availability of complex electronic systems showcases his expertise and dedication to improving technology. His contributions continue to influence the field and enhance system reliability.

Profile summary based on public USPTO records.
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