Cat Spring, TX, United States of America

Laurie Diane Donovan

This inventor holds 2 USPTO granted patents. Top assignee: General Electric Company. Active years: 2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Laurie Diane Donovan. Retrieved from https://idiyas.com/inventor/laurie-diane-donovan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 2

Forward Citations = 30(Granted Patents)


Company Filing History:


Years Active: 2007

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2 patents (USPTO):Explore Patents

Title: Innovations by Laurie Diane Donovan

Introduction

Laurie Diane Donovan is an accomplished inventor based in Cat Spring, TX (US). She has made significant contributions to the field of rotary machinery inspection, holding 2 patents that showcase her expertise and innovative spirit.

Latest Patents

One of her latest patents is titled "Methods and apparatus for rotary machinery inspection." This patent describes a method of non-destructive evaluation (NDE) testing for components of an assembly. The method involves positioning a transducer on a face of the component, transmitting ultrasonic waves into the component at various steering angles, receiving ultrasonic echoes, and analyzing these echoes to determine the acoustic impedance interfaces within the component.

Career Highlights

Laurie is currently employed at General Electric Company, where she applies her knowledge and skills to advance technology in her field. Her work has been instrumental in improving the safety and efficiency of rotary machinery through innovative inspection methods.

Collaborations

Laurie collaborates with Gerald John Czerw, leveraging their combined expertise to drive advancements in their projects.

Conclusion

Laurie Diane Donovan's contributions to rotary machinery inspection through her patents reflect her dedication to innovation and excellence in engineering. Her work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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