Espoo, Finland

Lauri Karhu

This inventor holds 1 USPTO granted patent. Top assignee: Outokumpu Mintec Oy. Active years: 1996.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Lauri Karhu. Retrieved from https://idiyas.com/inventor/lauri-karhu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 1996

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1 patent (USPTO):Explore Patents

Title: Lauri Karhu: Innovator in Particle Size Measurement

Introduction

Lauri Karhu is a notable inventor based in Espoo, Finland. He has made significant contributions to the field of particle size measurement, particularly through his innovative patent. His work is essential for industries that rely on precise measurements of solid particles in various materials.

Latest Patents

Lauri Karhu holds a patent for a "Method for measuring particle size distribution." This invention focuses on measuring the particle size distribution of a flowing material composed of solid particles in a carrier fluid. The method employs a measuring element that consists of first and second measuring members with respective confronting measuring surfaces of predetermined area. A mechanism is included to cause relative movement of the measuring members toward and away from each other. The area of each measuring surface is designed to be at least 0.008-0.5 cm² per percent solids of the flowing material. This innovation is crucial for enhancing the accuracy of particle size measurements in various applications.

Career Highlights

Lauri Karhu is associated with Outokumpu Mintec Oy, a company known for its expertise in mining and mineral processing technologies. His role at the company allows him to apply his innovative ideas and contribute to advancements in the industry.

Conclusion

Lauri Karhu's work in developing methods for measuring particle size distribution showcases his commitment to innovation in the field. His contributions are vital for improving measurement techniques in various industries.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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