Scappoose, OR, United States of America

Laurent A Melling, Jr


Average Co-Inventor Count = 1.6

ph-index = 3

Forward Citations = 18(Granted Patents)


Company Filing History:


Years Active: 1986-2017

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4 patents (USPTO):Explore Patents

Title: Innovations by Laurent A Melling, Jr.

Introduction

Laurent A Melling, Jr. is an accomplished inventor based in Scappoose, OR (US). He has made significant contributions to the field of test and measurement technology, holding a total of 4 patents. His work focuses on enhancing the efficiency and accuracy of measurement devices and systems.

Latest Patents

One of Melling's latest patents is a test and measurement device, system, and method for providing synchronized measurement views. This invention allows for the synchronization of measurement views and configuration parameters across multiple input channels or devices. The method involves receiving signals under test, selecting a measurement view, and synchronizing the measurement view or configuration parameters of other signals or devices based on user preferences. Another notable patent is related to a test signal generator that applies a test pattern to a device under test. This device features a variable cursor that can be adjusted to pinpoint anomalies in the displayed test pattern, enhancing the operator's ability to analyze the output waveform effectively.

Career Highlights

Laurent A Melling, Jr. is currently employed at Tektronix, Inc., a leading company in the field of test and measurement solutions. His role involves developing innovative technologies that improve measurement accuracy and user experience. Melling's expertise in this area has positioned him as a key contributor to the advancements in measurement devices.

Collaborations

Melling has collaborated with notable coworkers such as Edward D Wardzala and Douglas C Stevens. Their combined efforts have led to the development of cutting-edge technologies in the test and measurement industry.

Conclusion

Laurent A Melling, Jr. continues to push the boundaries of innovation in test and measurement technology. His patents reflect a commitment to improving measurement systems, making significant contributions to the field.

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