This inventor holds 1 USPTO granted patent. Top assignees: Ford-Werke Ag, Isotopen-Technik Dr. Sauerwein Gmbh. Active years: 1991.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1991
Title: Laurence F Topping: Innovator in Surface Crack Detection
Introduction
Laurence F Topping is a notable inventor based in Romford, GB. He has made significant contributions to the field of surface crack detection through his innovative patent. His work has implications for various industries, particularly in quality control and material integrity.
Latest Patents
Topping holds a patent for a "Process and device for detecting and evaluating surface cracks in workpieces." This invention utilizes a video camera to capture images of the workpiece surface, which are then digitized and processed by a computer. The process generates a binary image highlighting any cracks present. A sorting report is triggered when a preselected threshold level is exceeded. To ensure the sorting signal is independent of the original picture's brightness, a blurred background is derived from the original image. This difference picture effectively represents the cracks. The invention also includes a dynamic threshold level determined by comparing grey shade distributions, allowing for accurate defect identification.
Career Highlights
Throughout his career, Topping has worked with reputable companies, including Ford-Werke AG and Isotopen-Technik Dr. Sauerwein GmbH. His experience in these organizations has contributed to his expertise in the field of surface evaluation and defect detection.
Collaborations
Topping has collaborated with notable professionals such as Rainer Link and Kurt Sauerwein. These partnerships have likely enriched his work and expanded the impact of his innovations.
Conclusion
Laurence F Topping's contributions to the field of surface crack detection through his patented process demonstrate his innovative spirit and commitment to advancing technology. His work continues to influence quality control practices across various industries.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile