Edgewood, NM, United States of America

Laura E Martin

This inventor holds 1 USPTO granted patent. Top assignee: Sandia Corporation. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Laura E Martin. Retrieved from https://idiyas.com/inventor/laura-e-martin

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Innovations of Laura E Martin

Introduction

Laura E Martin is an accomplished inventor based in Edgewood, NM (US). She has made significant contributions to the field of trace detection through her innovative work. Her expertise in portable Raman systems has led to advancements in the detection of analytes.

Latest Patents

Laura holds 1 patent for her invention titled "Trace detection of analytes using portable Raman systems." This patent discloses apparatuses and methods for in situ detection of trace amounts of analytes. The invention features a surface-enhanced Raman spectroscopy (SERS) insert that includes a passageway with a SERS surface designed to adsorb molecules of an analyte of interest. A concentrated sample flows over the SERS surface, which is then analyzed using a portable Raman spectroscopy system.

Career Highlights

Laura is currently employed at Sandia Corporation, where she continues to develop her innovative ideas. Her work has been instrumental in enhancing the capabilities of trace detection technologies.

Collaborations

Laura has collaborated with notable colleagues, including M Kathleen Alam and Peter J Hotchkiss, contributing to a dynamic research environment.

Conclusion

Laura E Martin's contributions to the field of trace detection through her innovative patent demonstrate her commitment to advancing technology. Her work at Sandia Corporation and collaborations with esteemed colleagues further highlight her impact in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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