Shanghai, China

Laura Chen

This inventor holds 1 USPTO granted patent. Top assignee: Ebay, Incorporated. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Laura Chen. Retrieved from https://idiyas.com/inventor/laura-chen-kltnfrs0

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Laura Chen and Performance Anomaly Detection

Introduction

Laura Chen is an inventor associated with Shanghai, China, and eBay, Incorporated. Her listed patent concerns detecting unusual performance metrics and alerting users to potential issues.

Latest Patents

Chen is associated with 1 patent, titled “Performance Anomaly Detection and Smart Alerting.” The technology uses a performance anomaly detection model to identify metrics, such as cost-per-click data, that exceed an anomaly threshold. It can receive performance metrics from third-party servers and compare them with historical data, including data associated with particular time periods or geographic locations. When the model detects an anomaly, it can provide notifications or display relevant information on a user’s device.

Career Highlights

The available information associates Chen with eBay, Incorporated, and identifies her as an inventor on the performance anomaly detection patent. The disclosed approach applies historical performance data to help identify unusual changes and bring them to a user’s attention.

Collaborations

Zichao Liu and Qingbo Yang are listed as Chen’s coworkers. The provided information does not specify their roles in the patent or the nature of their collaboration.

Conclusion

Laura Chen’s listed invention focuses on using historical performance metrics to detect anomalies and deliver timely alerts, connecting data analysis with practical monitoring tools.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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