Lary J Beaulieu

Title: Lary J Beaulieu: Innovator in Integrated Circuit Testing

Introduction

Lary J Beaulieu is a notable inventor based in Cocoa, Florida, recognized for his contributions to the field of integrated circuit testing. With a focus on enhancing the efficiency and accuracy of testing methods, Beaulieu has made significant strides in the technology sector.

Latest Patents

Beaulieu holds a patent for a "Method and apparatus for testing integrated circuits." This innovative apparatus is designed to be integrated with automatic IC DIP component handling equipment. It conducts a preselected verification check of each integrated circuit device, regardless of its orientation in the device contact receptacle. The apparatus performs a pin-check residual voltage measurement test to ensure all pins of the device under test (DUT) are in contact with the test head's contact terminals. If the DUT passes this test, a non-destructive impedance measurement test is conducted to determine the orientation of the DIP. The system is designed to maximize testing efficiency while also performing traditional CPU functions during the test execution.

Career Highlights

Beaulieu's career is marked by his work at Fairchild Camera and Instrument Corporation, where he has contributed to advancements in integrated circuit technology. His innovative approach has led to the development of testing methods that improve the reliability of electronic components.

Collaborations

Throughout his career, Beaulieu has collaborated with notable colleagues, including Scott D Grimes and Douglas A Reed. These partnerships have fostered an environment of innovation and have contributed to the success of various projects.

Conclusion

Lary J Beaulieu's work in integrated circuit testing exemplifies the impact of innovation in technology. His patent and contributions to Fairchild Camera and Instrument Corporation highlight his commitment to advancing the field.