Uppsala, Sweden

Lars-Göran Öfverstedt

This inventor holds 1 USPTO granted patent. Top assignee: Okinawa Institute of Science and Technology Promotion Corporation. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Lars-Göran Öfverstedt. Retrieved from https://idiyas.com/inventor/lars-göran-öfverstedt

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Lars-Göran Öfverstedt: Innovator in Image Analysis

Introduction

Lars-Göran Öfverstedt is a notable inventor based in Uppsala, Sweden. He has made significant contributions to the field of image analysis, particularly in solving ill-posed inverse problems. His innovative approach has implications for various applications, including electron tomography.

Latest Patents

Lars-Göran Öfverstedt holds a patent for "Iterated variational regularization combined with componentwise regularization." This invention provides a method for addressing challenges in image analysis by recovering the structure of a sample. The method involves determining reliable prior knowledge, establishing an initial guess, and selecting a suitable regularization method, among other steps.

Career Highlights

Lars-Göran Öfverstedt is affiliated with the Okinawa Institute of Science and Technology Promotion Corporation. His work at this institution has allowed him to explore advanced techniques in image analysis and contribute to the scientific community.

Collaborations

Lars-Göran has collaborated with esteemed colleagues such as Ozan Öktem and Hans Rullgàrd. Their joint efforts have furthered research in the field and enhanced the impact of their innovations.

Conclusion

Lars-Göran Öfverstedt is a prominent figure in the realm of image analysis, with a focus on innovative solutions for complex problems. His contributions continue to influence the field and inspire future research.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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