Vasteras, Sweden

Lars-Erik Lindback


Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 1976

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1 patent (USPTO):Explore Patents

Title: Lars-Erik Lindback: Innovator in Shear Force Measurement Technology

Introduction

Lars-Erik Lindback is a notable inventor based in Vasteras, Sweden. He has made significant contributions to the field of measurement technology, particularly in the area of shear force measurement. His innovative approach has led to the development of a unique patent that addresses specific challenges in measuring shear stresses.

Latest Patents

Lindback holds a patent for a "Magnetoelastic shear force measuring means for measuring shear stress." This invention is designed for measuring shear stresses in tubular axles, with a particular focus on aircraft landing gear axles. The patent describes a system that comprises two shear stress transducers. Each transducer features an iron core with winding to generate a magnetic field in the measuring object, along with a second iron core with winding to sense the field alterations caused by shear stresses. The transducers are combined to form a measuring unit that is inserted into the tubular axle. The windings on the cores are configured to add shear signals while subtracting signals from any torsion that may occur.

Career Highlights

Lindback's career is marked by his work at Allmanna Svenska Elektriska Aktiebolaget, where he has applied his expertise in measurement technology. His innovative contributions have positioned him as a key figure in the development of advanced measurement systems.

Collaborations

Throughout his career, Lindback has collaborated with notable colleagues, including Nils-Ove Bielsten and Orvar Dahle. These partnerships have fostered an environment of innovation and have contributed to the advancement of measurement technologies.

Conclusion

Lars-Erik Lindback's work in shear force measurement technology exemplifies the impact of innovation in engineering. His patent reflects a significant advancement in the field, showcasing his dedication to improving measurement accuracy in critical applications.

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