Carmel, IN, United States of America

Larry Wayne Mcintyre

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Beckman Coulter, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Larry Wayne Mcintyre. Retrieved from https://idiyas.com/inventor/larry-wayne-mcintyre-lk4cewlc

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Larry Wayne Mcintyre and Density-Gradient Technology

Introduction

Larry Wayne Mcintyre is an inventor associated with Carmel, Indiana, and Beckman Coulter, Inc. His patent work concerns a system for measuring and reproducing density gradients.

Latest Patents

Mcintyre is credited with 1 patent: “Non-destructive measurement, dispense, and replication of density gradients.” The invention measures a density gradient at points along its length and uses those measurements to create a profile. Based on that profile, the system can replicate the gradient in a second container. It inserts a probe into the container and pumps separate components through a manifold and mixing chamber to dispense the gradient automatically.

Career Highlights

Mcintyre’s listed invention focuses on automating the measurement and replication of density gradients without destroying the original gradient. The system’s profile-based approach is designed to reproduce the gradient using separate components.

Collaborations

Mcintyre is associated with Beckman Coulter, Inc. His listed coworkers include Matthew Aaron Halsmer and Steven Adam Kibler.

Conclusion

Larry Wayne Mcintyre’s patent describes an automated approach to measuring and reproducing density gradients, connecting his inventive work with Beckman Coulter, Inc.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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