Pleasanton, CA, United States of America

Larry L Mohr

This inventor holds 1 USPTO granted patent. Top assignee: Mouse Systems Corporation. Active years: 1991.


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 1991

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1 patent (USPTO):Explore Patents

Title: Larry L Mohr: Innovator in Optical Scanning Technology

Introduction

Larry L Mohr is a notable inventor based in Pleasanton, California. He has made significant contributions to the field of optical scanning technology. His innovative approach has led to the development of a unique patent that enhances the functionality of text scanning systems.

Latest Patents

Larry L Mohr holds a patent for a "Reference grid for optical scanner." This invention features a wavelength-selective pad that is transparent when viewed by light of a first wavelength, such as visible light, and highly reflective when viewed by light of a second wavelength, such as infrared light. The design includes a grid positioned above a highly reflecting layer, allowing the grid to be sensed using infrared light while simultaneously enabling the reading of images, graphics, or text below the pad with visible light. This dual functionality is achieved through a text scanner system that produces and senses light at both wavelengths.

Career Highlights

Larry L Mohr has worked with Mouse Systems Corporation, where he has applied his expertise in optical technologies. His work has contributed to advancements in scanning systems, making them more efficient and versatile.

Collaborations

Larry has collaborated with James R Montgomery, further enhancing the innovative capabilities within his field. Their partnership has likely fostered the development of new ideas and technologies.

Conclusion

Larry L Mohr's contributions to optical scanning technology exemplify the impact of innovation in enhancing everyday tools. His patent reflects a significant advancement in the ability to read and interpret information through advanced optical methods.

Profile summary based on public USPTO records.
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