Waukesha, WI, United States of America

Larry Janicsek

This inventor holds 1 USPTO granted patent. Top assignee: Midwest Instrument Co., Inc.. Active years: 1991.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Larry Janicsek. Retrieved from https://idiyas.com/inventor/larry-janicsek

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 1991

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1 patent (USPTO):Explore Patents

Title: Larry Janicsek: Innovator in Carbon Sampling Technology

Introduction

Larry Janicsek is a notable inventor based in Waukesha, Wisconsin. He has made significant contributions to the field of carbon sampling technology. His innovative approach has led to the development of a unique method and apparatus for obtaining accurate carbon samples in ultra-low carbon melts.

Latest Patents

Larry Janicsek holds one patent titled "Method and apparatus for obtaining accurate sample." This patent describes a sophisticated sampling apparatus that includes a capping system for the fill tube, utilizing Pyrex or low carbon steel caps. The invention also features preheating or preigniting parts to eliminate contaminants, and a zircon coating is employed around the immersion vehicle to prevent carbon contaminants from reaching the sample mold.

Career Highlights

Larry is associated with Midwest Instrument Co., Inc., where he applies his expertise in developing advanced sampling technologies. His work has been instrumental in enhancing the accuracy of carbon sampling processes, which is crucial for various industrial applications.

Collaborations

Larry has collaborated with notable colleagues, including Richard A. Falk and Joseph J. Boron. Their combined efforts have contributed to the advancement of technologies in their field.

Conclusion

Larry Janicsek's innovative contributions to carbon sampling technology demonstrate his commitment to improving industrial processes. His patent reflects a significant advancement in ensuring the accuracy of carbon samples, which is vital for various applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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