Laurel, MD, United States of America

Larry J Paxton

This inventor holds 1 USPTO granted patent. Top assignee: Johns Hopkins University. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Larry J Paxton. Retrieved from https://idiyas.com/inventor/larry-j-paxton

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Larry J Paxton: Innovator in Tomographic Retrieval Systems

Introduction

Larry J Paxton is an accomplished inventor based in Laurel, MD (US). He has made significant contributions to the field of measurement systems, particularly through his innovative patent that enhances the understanding of parameter profiles in various mediums.

Latest Patents

Larry J Paxton holds a patent for a "System and method for tomographic retrieval of parameter profile from traveling path." This invention involves a system designed to measure a parameter of a medium using a vehicle that moves through it. The system includes four detecting portions that capture values of the parameter from different lines-of-sight at various positions and times. The calculated parameter is derived from these values and their respective intersections, showcasing a sophisticated approach to data retrieval.

Career Highlights

Larry is affiliated with Johns Hopkins University, where he applies his expertise in innovative measurement technologies. His work has contributed to advancements in the field, particularly in tomographic systems.

Collaborations

Larry has collaborated with notable colleagues, including Michael A Kelly and Joseph M Comberiate. Their combined efforts have furthered research and development in their respective areas of expertise.

Conclusion

Larry J Paxton's contributions to the field of tomographic retrieval systems exemplify his innovative spirit and dedication to advancing measurement technologies. His work continues to influence the industry and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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