Larry J Ott

Title: Larry J Ott - Innovator in X-ray Backscatter Imaging

Introduction

Larry J Ott is a notable inventor based in Knoxville, TN (US). He has made significant contributions to the field of imaging technology, particularly in the detection of structural discontinuities in materials. His innovative approach utilizes X-ray backscatter imaging to enhance the inspection of nuclear materials.

Latest Patents

Larry J Ott holds a patent for his invention titled "X-ray backscatter imaging of nuclear materials." This patent focuses on selecting the energy of an X-ray beam and critical depth to effectively detect structural discontinuities in materials with an atomic number Z of 57 or greater. The critical depth is determined by adjusting the geometry of a collimator that blocks backscattered radiation, ensuring that only relevant backscattered X-rays are detected. This technology is particularly useful for inspecting structures of Lanthanides and Actinides, including nuclear fuel rod materials, for issues such as gaps, cracks, and chipping.

Career Highlights

Larry J Ott is associated with UT-Battelle, Inc., where he applies his expertise in imaging technology. His work has contributed to advancements in the field, particularly in the safety and inspection of nuclear materials. With 1 patent to his name, he has established himself as a key figure in this specialized area of research.

Collaborations

Throughout his career, Larry has collaborated with notable colleagues, including Jeffrey Allen Chapman and John E Gunning. These partnerships have fostered innovation and have been instrumental in the development of advanced imaging techniques.

Conclusion

Larry J Ott's contributions to X-ray backscatter imaging represent a significant advancement in the inspection of nuclear materials. His innovative patent and collaborative efforts highlight his commitment to enhancing safety and technology in this critical field.