The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2014
Filed:
Nov. 03, 2011
Jeffrey Allen Chapman, Knoxville, TN (US);
John E. Gunning, Oak Ridge, TN (US);
Daniel F. Hollenbach, Oak Ridge, TN (US);
Larry J. Ott, Knoxville, TN (US);
Daniel Shedlock, Knoxville, TN (US);
Jeffrey Allen Chapman, Knoxville, TN (US);
John E. Gunning, Oak Ridge, TN (US);
Daniel F. Hollenbach, Oak Ridge, TN (US);
Larry J. Ott, Knoxville, TN (US);
Daniel Shedlock, Knoxville, TN (US);
UT-Battelle, LLC, Oak Ridge, TN (US);
Abstract
The energy of an X-ray beam and critical depth are selected to detect structural discontinuities in a material having an atomic number Z of 57 or greater. The critical depth is selected by adjusting the geometry of a collimator that blocks backscattered radiation so that backscattered X-ray originating from a depth less than the critical depth is not detected. Structures of Lanthanides and Actinides, including nuclear fuel rod materials, can be inspected for structural discontinuities such as gaps, cracks, and chipping employing the backscattered X-ray.