Lamberto De Mateo Beleno, Jr

Title: Lamberto De Mateo Beleno, Jr: Innovator in Semiconductor Testing

Introduction

Lamberto De Mateo Beleno, Jr. is a notable inventor based in Milpitas, CA (US). He has made significant contributions to the field of semiconductor testing, particularly through his innovative patent. His work has implications for the efficiency and accuracy of testing semiconductor devices.

Latest Patents

Lamberto holds a patent for a "Device frequency measurement system." This invention outlines a method for testing semiconductor devices on a wafer. It includes a testing circuit formed on the wafer that provides an output signal indicative of at least one operational characteristic of the devices. The output signal is compatible for monitoring using an integrated circuit tester. The testing circuit comprises an oscillator, an N-bit counter, and an N-bit shift register, all integrated on the semiconductor wafer. The process involves the tester resetting the counter and enabling the oscillator, which produces oscillator pulses at a specific frequency. The counter counts these pulses during a predetermined time period, producing a pulse count that corresponds to the number of oscillator pulses received. The shift register then receives this count as an N-bit digital data word, which the tester manipulates to determine a count value. Ultimately, the tester calculates an oscillator frequency value by dividing the count value by a time value corresponding to the predetermined time period. Lamberto has 1 patent to his name.

Career Highlights

Lamberto is currently employed at LSI Logic Corporation, where he continues to contribute to advancements in semiconductor technology. His work has been instrumental in enhancing the testing processes for semiconductor devices, making them more efficient and reliable.

Collaborations

Lamberto has collaborated with talented individuals such as Son Truong Nguyen and Sudhakar R Gouravaram. These collaborations have fostered innovation and have led to significant advancements in their respective fields.

Conclusion

Lamberto De Mateo Beleno, Jr. is a distinguished inventor whose contributions to semiconductor testing have made a lasting impact. His innovative patent demonstrates his commitment to improving technology in this critical area.