Seattle, WA, United States of America

Lakshay Kharbanda

This inventor holds 1 USPTO granted patent. Top assignee: Amazon Technologies, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Lakshay Kharbanda. Retrieved from https://idiyas.com/inventor/lakshay-kharbanda

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Lakshay Kharbanda: Innovator in Anomaly Detection

Introduction

Lakshay Kharbanda is an accomplished inventor based in Seattle, WA. He is known for his innovative contributions to the field of machine learning and anomaly detection. His work focuses on dynamically provisioning resources to enhance the efficiency of detecting anomalies in time series data.

Latest Patents

Lakshay holds a patent titled "Dynamically provisioning resources for detecting anomalies in time series data using machine learning models." This patent describes a method for determining the expected workload of anomaly detection on time series data. It outlines how computing resources can be dynamically provisioned and updated when the machine learning model is re-trained. He has 1 patent to his name.

Career Highlights

Lakshay is currently employed at Amazon Technologies, Inc., where he applies his expertise in machine learning to develop advanced solutions for data analysis. His work has significantly contributed to improving the accuracy and efficiency of anomaly detection processes.

Collaborations

He has collaborated with notable colleagues, including Ranjith Kumar Bodla and Sadanand Murthy Sachidananda, who share his passion for innovation in technology.

Conclusion

Lakshay Kharbanda is a prominent figure in the realm of machine learning and anomaly detection. His innovative patent and contributions at Amazon Technologies, Inc. highlight his commitment to advancing technology in this critical field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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