Hopewell Junction, NY, United States of America

Labh S Bhangu

This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 1993.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Labh S Bhangu. Retrieved from https://idiyas.com/inventor/labh-s-bhangu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 58(Granted Patents)


Company Filing History:


Years Active: 1993

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1 patent (USPTO):Explore Patents

Title: Labh S Bhangu: Innovator in Test Systems

Introduction

Labh S Bhangu is a notable inventor based in Hopewell Junction, NY (US). He has made significant contributions to the field of test systems, particularly in reducing contact resistance in testing environments. His innovative approach has led to the development of a patented technology that enhances the efficiency of testing processes.

Latest Patents

Labh S Bhangu holds a patent for a "Test system with reduced test contact interface resistance." This improved test system incorporates means for generating a contact wetting pulse, which is applied to a network. This technology effectively lowers the contact resistance at the interfaces between the probes of the test system and the terminals of the network. He has 1 patent to his name, showcasing his commitment to innovation in this area.

Career Highlights

Labh S Bhangu is associated with International Business Machines Corporation, commonly known as IBM. His work at IBM has allowed him to collaborate with other talented professionals in the field, contributing to advancements in technology and testing methodologies.

Collaborations

Some of his notable coworkers include Thomas Clarke Morrison and Klaus Probst. Their collective expertise has fostered an environment of innovation and collaboration within the company.

Conclusion

Labh S Bhangu's contributions to the field of test systems exemplify the impact of innovative thinking in technology. His patented work continues to influence testing processes, making them more efficient and effective.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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