This inventor holds 2 USPTO granted patents. Top assignee: Phase Metrics, Inc.. Active years: 1998.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1998
Title: Innovations of L Allan Butler
Introduction
L Allan Butler is a notable inventor based in Carlsbad, California. He has made significant contributions to the field of optical testing and measurement. With a total of two patents to his name, Butler's work focuses on advancing technology in non-contact optical methods.
Latest Patents
One of Butler's latest patents is the "Non-contact optical glide tester." This invention provides a non-contact optical method and apparatus for inspecting and measuring defects on a disk. The apparatus generates an interference pattern from a reference beam reflected from a surface of a transparent slider and a second beam reflected from a surface of a test disk. The resulting interference pattern is processed by a set of photodetectors and processing electronics to quantify and map the location and magnitude of asperities on the disk.
Another significant patent is "Determining the complex refractive index phase offset in interferometric." This apparatus and method optically measure the air gap between a transparent glass disk and an air bearing slider without separately measuring the real index of refraction and extinction coefficient of the slider using an external ellipsometer. The phase offset required to compute the air gap is derived from a measurement of the air slider reflectivity and an empirically derived equation that correlates the index of refraction with the reflectance of the slider. The apparatus includes a light source for directing a light beam through the transparent member and air gap, and onto the reflective slider. The reflected light is detected by a photodetector coupled to a computer, allowing for the calculation of the phase offset and space.
Career Highlights
L Allan Butler is currently associated with Phase Metrics, Inc., where he continues to innovate in the field of optical measurement technologies. His work has been instrumental in developing advanced testing methods that enhance the quality and reliability of optical components.
Collaborations
Butler has collaborated with notable colleagues, including Kenneth H Womack and Michael Wahl, contributing to a dynamic environment of innovation and research.
Conclusion
L Allan Butler's contributions to optical testing and measurement through his patents reflect his commitment to advancing technology in this field. His work at Phase Metrics, Inc. continues to influence the industry positively.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile