Gyeonggi-do, South Korea

Kyungjin Yoon

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kyungjin Yoon. Retrieved from https://idiyas.com/inventor/kyungjin-yoon-f00htnp4

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Kyungjin Yoon and Vehicle Safety Innovation

Introduction

Kyungjin Yoon is an inventor associated with Samsung Electronics Co., Ltd. in Gyeonggi-do, South Korea. Her patent work includes an electronic device and operating method designed to help assess accident risk around a vehicle.

Latest Patents

Yoon is associated with 1 patent: “Electronic Device for Vehicle and Operating Method Thereof.” The invention describes a system that stores accident modeling information, such as accident history at a location and relevant driver profiles. It can receive driving-characteristic information from a nearby vehicle, use that information alongside the stored data to generate accident risk information, and present the result through an output interface.

Career Highlights

The patent reflects work at the intersection of vehicle electronics, communication between vehicles, and safety-related risk assessment. It describes how information about local accident history and nearby drivers’ characteristics can contribute to an assessment of potential risk.

Collaborations

The provided information lists Minwoo Song and Chulmin Lee as Yoon’s coworkers. The patent description concerns a vehicle safety system that uses information from multiple sources, including a nearby external vehicle.

Conclusion

Kyungjin Yoon’s patent work at Samsung Electronics focuses on using vehicle and driver information to generate and communicate accident risk assessments.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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