Company Filing History:
Years Active: 2010
Title: Kyunghun Chang: Innovator in Semiconductor Testing Technology
Introduction
Kyunghun Chang is a notable inventor based in Yongin, South Korea. He has made significant contributions to the field of semiconductor testing, particularly through his innovative designs and technologies. His work has been recognized for its impact on improving testing efficiency and accuracy in semiconductor devices.
Latest Patents
Kyunghun Chang holds a patent for a "Semiconductor test head apparatus using field programmable gate array." This invention involves a semiconductor test head apparatus that utilizes a field programmable gate array (FPGA). The apparatus includes a pattern generator that creates a predetermined memory test pattern. It also features a driver/comparator unit with two transceivers. The first transceiver performs a driver function to record the memory test pattern in a device under test and a comparator function to compare the signal level read by the device with a predetermined high-level reference value. The second transceiver also performs both driver and comparator functions, comparing the signal level with a predetermined low-level reference value. Additionally, a connection unit electrically connects the first and second transceivers to the device under test.
Career Highlights
Kyunghun Chang is currently employed at Itt Corporation, where he continues to develop and refine technologies related to semiconductor testing. His expertise in the field has positioned him as a key player in advancing testing methodologies and enhancing product reliability.
Collaborations
Kyunghun Chang has collaborated with talented coworkers, including Chulki Jang and Mangil Kang. Their combined efforts contribute to the innovative environment at Itt Corporation, fostering advancements in semiconductor technology.
Conclusion
Kyunghun Chang's contributions to semiconductor testing technology through his patent and work at Itt Corporation highlight his role as an influential inventor in the industry. His innovative approaches continue to shape the future of semiconductor testing.