The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2010
Filed:
Oct. 24, 2008
Kyunghun Chang, Yongin, KR;
Chulki Jang, Icheon, KR;
Mangil Kang, Yongin, KR;
Sekyung OH, Seongnam, KR;
Kyunghun Chang, Yongin, KR;
Chulki Jang, Icheon, KR;
Mangil Kang, Yongin, KR;
Sekyung Oh, Seongnam, KR;
IT&T, Suwon, KR;
Abstract
A semiconductor test head apparatus using a field programmable gate array (FPGA) is disclosed. A semiconductor test head apparatus using a field programmable gate array, includes a pattern generator for generating a predetermined memory test pattern, a driver/comparator unit comprising a first transceiver which performs a driver function capable of recording a memory test pattern generated from the pattern generator in a device under test and a comparator function capable of comparing a level of a signal read by the device under test with a predetermined high-level reference value, and a second transceiver which performs the driver function and a comparator function capable of comparing a level of a signal read by the device under test with a predetermined low-level reference value, and a connection unit for electrically connecting the first transceiver in parallel to the second transceiver, and connecting the first transceiver and the second transceiver to the device under test.