Suwon, South Korea

Kyung Il Ha

This inventor holds 1 USPTO granted patent. Top assignee: Hyosung Tns Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kyung Il Ha. Retrieved from https://idiyas.com/inventor/kyung-il-ha

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Kyung Il Ha and ATM Failure Diagnosis

Introduction

Kyung Il Ha is an inventor based in Suwon, South Korea. His work includes a patent for diagnosing ATM failures and providing maintenance information. He is associated with Hyosung TNS Inc.

Latest Patents

Ha’s listed patent, “Method for Diagnosing Failure of and Providing Maintenance Information About ATM,” describes a system for identifying the source of an ATM malfunction. When a failure occurs during a transaction, the system uses readings from sensors in the ATM to identify the node where an abnormal value was first measured. It then predicts the module that caused the abnormal operation and provides maintenance workers with information about both that cause and the module where the failure occurred. This helps workers repair the failed module as well as the module that contributed to the problem. Ha is listed with 1 patent.

Career Highlights

Ha’s patent focuses on improving ATM troubleshooting by connecting sensor data with actionable maintenance guidance. The invention is associated with Hyosung TNS Inc., a company working in the financial technology and ATM sector.

Collaborations

The provided information lists Keum Bo Na and Il Je Hyung as Ha’s coworkers. Their specific roles in the patent or related work are not stated.

Conclusion

Kyung Il Ha’s listed invention applies sensor-based diagnosis to ATM maintenance, helping technicians identify and address both the point of failure and its underlying cause.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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