This inventor holds 2 USPTO granted patents, plus 5 CIPO patents and 1 EPO patent. Top assignee: Research in Motion Corporation. Active years: 2008-2010.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2008-2010
Title: Kyun-Jung Chang: Innovator in Electronic Device Testing
Introduction
Kyun-Jung Chang is a notable inventor based in Waterloo, Canada. He has made significant contributions to the field of electronic device testing, holding a total of 2 patents. His innovative approaches have enhanced the efficiency and effectiveness of testing procedures in the electronics industry.
Latest Patents
One of Kyun-Jung Chang's latest patents is a clamping top plate using magnetic force. This invention involves a test fixture designed for testing electronic devices. The test fixture includes a test platform with electrically conductive contacts that protrude from a device receiving surface. It also features a positioning guide and a device retention cover. The test platform contains a platform magnetic member, while the retention cover has a cover magnetic member, which are mutually magnetically attractive. The method of producing an electronic device includes preparing the test fixture, placing the electronic device using the positioning guide, and applying a force to the electronic device with the retention cover.
Career Highlights
Kyun-Jung Chang has worked with prominent companies in the technology sector, including Research in Motion Corporation, known for its innovative mobile devices. His experience in these organizations has contributed to his expertise in electronic device testing and development.
Collaborations
Throughout his career, Kyun-Jung Chang has collaborated with notable professionals, including Arkady Ivannikov and Marek Reksnis. These collaborations have fostered a creative environment that has led to advancements in electronic testing technologies.
Conclusion
Kyun-Jung Chang's contributions to the field of electronic device testing through his patents and collaborations highlight his role as an innovator. His work continues to influence the industry and improve testing methodologies.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
