Suwon, South Korea

Kyoungwon Lee

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Electronics Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kyoungwon Lee. Retrieved from https://idiyas.com/inventor/kyoungwon-lee-fa170zku

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Kyoungwon Lee and Memory-Device Control Innovation.

Introduction

Kyoungwon Lee is an inventor based in Suwon, South Korea, whose patent work concerns system-on-chip technology for controlling memory devices. His disclosed invention focuses on data training, helping a system determine signal delays when communicating with memory.

Latest Patents

Lee is associated with 1 patent, titled “System-on-Chip for Controlling Memory Devices and Its Data Training Method.” The patent describes a SoC with a memory interface for exchanging commands and data, alongside control logic that sends clock and data signals to a memory device.

During training, the control logic transmits data pieces using different delay times and then issues read commands to retrieve them. It analyzes the patterns of the received data to determine a delay value, supporting the calibration of communication between the SoC and memory device.

Career Highlights

Lee’s listed patent is associated with Samsung Electronics Ltd. The invention addresses memory-interface data training, a technical process for evaluating signal timing in SoC-to-memory communication.

Collaborations

Daero Kim and Boyoung Kang are identified as Lee’s coworkers. The available information does not specify their roles in the patent or whether they collaborated on the invention.

Conclusion

Kyoungwon Lee’s patent work at Samsung Electronics Ltd. centers on improving memory-device control through SoC-based data training and delay evaluation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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