Yokohama, Japan

Kyouichi Fujita

This inventor holds 1 USPTO granted patent. Top assignee: Kabushiki Kaisha Toshiba. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kyouichi Fujita. Retrieved from https://idiyas.com/inventor/kyouichi-fujita

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 9.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Kyouichi Fujita: Innovator in Inner Image Generation

Introduction

Kyouichi Fujita is a notable inventor based in Yokohama, Japan. He has made significant contributions to the field of imaging technology, particularly through his innovative patent related to inner image generation.

Latest Patents

Fujita holds a patent for an "Inner image generating apparatus and method thereof." This invention includes a first receiver that captures inlet track information and the first passage time of a muon. Additionally, it features a second receiver for outlet track information and the second passage time of the muon. The apparatus calculates track displacement and mean energy of the muon, integrating this data to generate an inner image of structures.

Career Highlights

Kyouichi Fujita is associated with Kabushiki Kaisha Toshiba, a leading technology company. His work has been instrumental in advancing imaging techniques, showcasing his expertise and innovative spirit.

Collaborations

Fujita has collaborated with notable coworkers, including Tsukasa Sugita and Haruo Miyadera. Their combined efforts have contributed to the success of various projects within their field.

Conclusion

Kyouichi Fujita's contributions to inner image generation technology highlight his role as a significant inventor in the industry. His innovative patent and collaboration with esteemed colleagues reflect his dedication to advancing technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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