Tokyo, Japan

Kyota Kanno

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Nec Corporation. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kyota Kanno. Retrieved from https://idiyas.com/inventor/kyota-kanno

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Kyota Kanno: Inventor in Computational Resource Management.

Introduction

Kyota Kanno is an inventor based in Tokyo, Japan, and is associated with NEC Corporation. His patent work focuses on computational resource management and planning data-processing tasks.

Latest Patents

Kanno is named on 1 patent: “Computational Resource Management Device, Computational Resource Management Method, and Computer-Readable Recording Medium.” The invention uses measured processing times, resource amounts, and input-data features to train a model that estimates the execution time of scheduled data processing. It then considers the estimate, its variation, and the distribution of estimated residuals to determine the resources required and create an execution plan.

Career Highlights

Kanno’s disclosed patent contribution addresses how computational resources can be allocated using data-driven estimates of processing time. The approach combines model-based predictions with measures of uncertainty and residual distribution to inform resource planning.

Collaborations

Kanno’s listed coworkers include Masato Asahara and Ryohei Fujimaki. His patent is associated with NEC Corporation.

Conclusion

Kyota Kanno’s patent describes a data-driven method for estimating processing needs and planning computational resources, reflecting his work in computational resource management.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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