Saitama, Japan

Kyosuke Okimi

This inventor holds 2 USPTO granted patents. Top assignee: Kabushiki Kaisha Saginomiya Seisakusho. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kyosuke Okimi. Retrieved from https://idiyas.com/inventor/kyosuke-okimi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 2

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2015

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2 patents (USPTO):Explore Patents

Title: The Innovations of Kyosuke Okimi

Introduction

Kyosuke Okimi is a notable inventor based in Saitama, Japan. He has made significant contributions to the field of technology, particularly with his innovative designs and patents. With a total of two patents to his name, Okimi continues to push the boundaries of engineering and invention.

Latest Patents

One of Okimi's latest patents is a pressure detector, which showcases his expertise in developing advanced sensing technologies. This invention is designed to enhance the accuracy and reliability of pressure measurements in various applications.

Career Highlights

Kyosuke Okimi is currently employed at Kabushiki Kaisha Saginomiya Seisakusho, a company known for its commitment to innovation and quality in manufacturing. His work at this organization has allowed him to collaborate with other talented engineers and inventors.

Collaborations

Throughout his career, Okimi has worked alongside notable colleagues such as Satoshi Miyakawa and Tomohiro Sakakibara. These collaborations have fostered a creative environment that encourages the development of groundbreaking technologies.

Conclusion

Kyosuke Okimi's contributions to the field of invention, particularly with his pressure detector patent, highlight his role as a significant innovator in Japan. His work continues to inspire future advancements in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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