Company Filing History:
Years Active: 2001
Title: Kyoko Minowa: Innovator in Semiconductor Manufacturing
Introduction
Kyoko Minowa is a prominent inventor based in Kokubunji, Japan. She has made significant contributions to the field of semiconductor manufacturing, particularly in defect assessment technologies. Her innovative work has led to the development of a unique apparatus and method that enhances the understanding of defects in semiconductor materials.
Latest Patents
Kyoko Minowa holds a patent for a "Defect assessing apparatus and method, and semiconductor manufacturing method." This invention reveals the relationship between the size and depth of defects in semiconductor materials. The patent describes a detecting optical system that measures the intensity of scattered light from defects using two different wavelengths. The system calculates values corresponding to defect size and depth, which are then displayed to illustrate their relationship.
Career Highlights
Kyoko Minowa is associated with Hitachi, Ltd., where she has been instrumental in advancing semiconductor technologies. Her work has not only contributed to the efficiency of semiconductor manufacturing but has also paved the way for further innovations in the industry.
Collaborations
Kyoko has collaborated with notable colleagues such as Kazuo Takeda and Makoto Ohkura. Their combined expertise has fostered a productive environment for innovation and development in semiconductor technologies.
Conclusion
Kyoko Minowa's contributions to semiconductor manufacturing through her innovative patent demonstrate her significant role in the field. Her work continues to influence advancements in technology and defect assessment methodologies.