Tokyo, Japan

Kyohei Yamakawa

This inventor holds 1 USPTO granted patent. Top assignee: Mitsubishi Electric Corporation. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kyohei Yamakawa. Retrieved from https://idiyas.com/inventor/kyohei-yamakawa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Kyohei Yamakawa: Innovator in Static Charge Elimination

Introduction

Kyohei Yamakawa is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of static charge elimination. His innovative approach addresses common challenges associated with static electricity in various applications.

Latest Patents

Yamakawa holds a patent for a "Static charge eliminator and static charge elimination method." This invention includes a charger with one or more charging units and a grounded needle-shaped conductor. The charger is designed to charge an insulating film to achieve a surface potential of 3 kV or more. The needle-shaped conductor generates a corona discharge, effectively eliminating static charges on the insulating film.

Career Highlights

Kyohei Yamakawa is associated with Mitsubishi Electric Corporation, where he applies his expertise in electrical engineering and innovation. His work has contributed to advancements in technology that enhance product performance and safety.

Collaborations

Yamakawa collaborates with talented colleagues, including Ryota Iriki and Takafumi Oka. Together, they work on projects that push the boundaries of technology and improve static charge management.

Conclusion

Kyohei Yamakawa's contributions to static charge elimination demonstrate his commitment to innovation and technology. His patent reflects a significant advancement in the field, showcasing his expertise and dedication to solving real-world problems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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