Kwun-bum Chung

Title: Kwun-bum Chung: Innovator in Defect Analysis Technology

Introduction

Kwun-bum Chung is a notable inventor based in Seoul, South Korea. He has made significant contributions to the field of defect analysis technology, particularly through his innovative patent. His work has implications for various industries, enhancing the understanding and management of defects in materials.

Latest Patents

Kwun-bum Chung holds a patent for a defect analysis device and method. This device includes a light source that irradiates an analysis target layer of an element with light. It features a position adjuster that fine-tunes the position of the analysis target to be irradiated. Additionally, it has a detector that measures the current flowing between a source area and a drain area of the element. The analyzer acquires quantitative data related to defects in the analysis target layer based on the measured current value. In a first mode, multiple areas of the analysis target layer are sequentially irradiated with light, allowing for comprehensive defect analysis.

Career Highlights

Throughout his career, Kwun-bum Chung has worked with prominent organizations. He has been associated with Samsung Display Co., Ltd., where he contributed to advancements in display technologies. Additionally, he has collaborated with the Dongguk University Industry-Academic Cooperation Foundation, further bridging the gap between academia and industry.

Collaborations

Due to space constraints, the details of his collaborations will not be elaborated upon.

Conclusion

Kwun-bum Chung's innovative work in defect analysis technology showcases his expertise and commitment to advancing the field. His contributions are valuable to both industry and academia, reflecting the importance of innovation in technology.