The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2025
Filed:
Jul. 31, 2023
Samsung Display Co., Ltd., Yongin-Si, KR;
Dongguk University Industry-academic Cooperation Foundation, Seoul, KR;
Yeon Keon Moon, Yongin-si, KR;
Jun Hyung Lim, Yongin-si, KR;
Kwun-Bum Chung, Seoul, KR;
Kwang Sik Jeong, Seoul, KR;
Hyun Min Hong, Seoul, KR;
Samsung Display Co., Ltd., Yongin-Si, KR;
Dongguk University Industry-Academic Cooperation Foundation, Seoul, KR;
Abstract
Provided is a defect analysis device which may include a light source that irradiates an analysis target layer of an element with light, a position adjuster that adjusts a position in the analysis target in the analysis target to be irradiated with the light, a detector that measures a current value of current flowing between a source area of the element electrically connected to one end of the analysis target layer and a drain area of the element electrically connected to the other end of the analysis target layer in the element, and an analyzer that acquires quantitative data related to a defect in the analysis target layer on the basis of the current value in which, in a first mode, a plurality of areas of the analysis target layer are sequentially irradiated with the light.