Kwokming J Cheng

Title: Kwokming J Cheng: Innovator in Metrology Systems

Introduction

Kwokming J Cheng is a notable inventor based in Lake Hiawatha, NJ (US). He has made significant contributions to the field of metrology, particularly in the analysis of panel misregistration during manufacturing processes. His innovative approach has led to the development of a unique system that enhances the accuracy and efficiency of panel production.

Latest Patents

Kwokming J Cheng holds a patent for a "Metrology system for analyzing panel misregistration in a panel." This system utilizes a software-controlled mechanism to check defined panel parameters at the four corners of a panel and related artwork. It employs a master pattern etched on a glass reference, combined with a machine vision measuring system, to ensure precise alignment. The system captures displacement and rotational differences, which are then analyzed by an intelligent analysis system to identify the causes of misregistration.

Career Highlights

Cheng has had a distinguished career at AT&T Bell Laboratories, where he has been instrumental in advancing metrology technologies. His work has not only contributed to the efficiency of manufacturing processes but has also set a standard for quality control in the industry. His innovative solutions have garnered recognition and respect among his peers.

Collaborations

Cheng has collaborated with esteemed colleagues such as Hans H Ammann and Richard F Kovacs. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas, further enhancing the impact of their work in the field.

Conclusion

Kwokming J Cheng's contributions to metrology systems exemplify the importance of innovation in manufacturing processes. His patent and career achievements reflect a commitment to excellence and a drive to improve industry standards.