Daejeon, South Korea

Kwang-Sup Kim

This inventor holds 1 USPTO granted patent. Top assignee: Korea Research Institute of Standards and Science. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kwang-Sup Kim. Retrieved from https://idiyas.com/inventor/kwang-sup-kim-op0vx1on

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Kwang-Sup Kim: Innovator in Gas Sample Collection Technology

Introduction

Kwang-Sup Kim is a notable inventor based in Daejeon, South Korea. He has made significant contributions to the field of gas analysis through his innovative inventions. His work focuses on improving the accuracy of gas sample collection and analysis methods.

Latest Patents

Kwang-Sup Kim holds a patent for an "Apparatus for collecting gas sample in foam, and analysis method using the same." This invention provides an apparatus designed to collect gas samples effectively from foam. The method involves grinding the foam to enhance gas sample collection and measuring pressure before and after the collection process. This innovation aims to increase the accuracy of gas analysis, allowing for a more precise evaluation of foam characteristics.

Career Highlights

Kwang-Sup Kim is affiliated with the Korea Research Institute of Standards and Science. His work at this esteemed institution has allowed him to focus on advancing technologies related to gas analysis and sample collection.

Collaborations

Some of his notable coworkers include Jin-Bok Lee and Jin-Seog Kim. Their collaborative efforts contribute to the ongoing research and development in the field of gas analysis.

Conclusion

Kwang-Sup Kim's innovative work in gas sample collection technology showcases his commitment to enhancing analytical methods. His contributions are vital for improving the accuracy of gas analysis, which is essential in various scientific applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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