Gyeonggi-do, South Korea

Kwang-Sik Han

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kwang-Sik Han. Retrieved from https://idiyas.com/inventor/kwang-sik-han-10esd52a

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

 

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Kwang-Sik Han and His Air-Conditioning Invention.

Introduction

Kwang-Sik Han is an inventor based in Gyeonggi-do, South Korea, and is associated with Samsung Electronics Co., Ltd. His work includes an invention focused on monitoring refrigerant circulation in an air conditioner.

Latest Patents

Han is credited with 1 patent: “Air Conditioner and Method for Controlling the Same.” The invention describes a system that measures indoor and outdoor air temperatures, along with the inlet and outlet temperatures of one or more indoor heat exchangers. A processor uses the air-temperature readings to determine a reference superheat degree, compares it with the temperature difference across the heat exchanger, and uses the comparison to assess whether refrigerant circulation is normal.

Career Highlights

The available information connects Han’s patent work with Samsung Electronics Co., Ltd. His invention addresses temperature-based monitoring and control in air-conditioning systems.

Collaborations

Han’s listed coworkers include Jong Woon Kim and Tae Woo Kim. The provided information does not specify their roles in the patent or the extent of their collaboration.

Conclusion

Kwang-Sik Han’s documented invention applies temperature measurements and processor-based comparison to help assess refrigerant circulation in air conditioners.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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