Houston, TX, United States of America

Kwang Hee Yoo

This inventor holds 1 USPTO granted patent and 2 published patent applications and 2 EPO patents. Top assignee: Precision Analyzer Company L.p.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kwang Hee Yoo. Retrieved from https://idiyas.com/inventor/kwang-hee-yoo-hvw3kwvb

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
Loading Chart...
1 patent (USPTO):Explore Patents

Title: Kwang Hee Yoo and Patent Innovation in Combustion Analysis.

Introduction

Kwang Hee Yoo is an inventor associated with Houston, Texas, and Precision Analyzer Company L.P. His patent work concerns using combustion measurements to estimate the research octane number of fuel samples.

Latest Patents

Yoo is named on 1 patent: “Prediction of Research Octane Number Using a Constant Volume Combustion Chamber.” The invention describes a device that performs a combustion test in a constant volume combustion chamber and records pressure measurements at multiple points during the test. A processor calculates pressure parameters from those measurements and combines them with a known research octane number to generate a function for estimating the octane numbers of other samples tested in the chamber.

Career Highlights

Yoo’s listed patent reflects an application of data processing to fuel analysis. By relating pressure behavior during combustion to research octane number, the disclosed approach aims to support consistent estimates using a constant volume combustion chamber.

Collaborations

Yoo’s listed coworkers include Michael Brosseau and Thomas Herold. His patent is associated with Precision Analyzer Company L.P.

Conclusion

Kwang Hee Yoo’s patent focuses on estimating fuel research octane numbers from combustion-chamber pressure data, connecting measurement technology with computational analysis.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…