Tucson, AZ, United States of America

Kwan Kit Lee

This inventor holds 1 USPTO granted patent. Top assignee: The University of Arizona. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kwan Kit Lee. Retrieved from https://idiyas.com/inventor/kwan-kit-lee

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Kwan Kit Lee: Inventor in Optical Measurement

Introduction

Kwan Kit Lee is an inventor based in Tucson, Arizona, and is associated with the University of Arizona. His patent work concerns adaptive optical measurement and the analysis of distributions of optical sources.

Latest Patents

Lee is credited with 1 patent, titled “Managing Adaptive Measurement for High-Resolution Measurement.” The invention describes imaging a distribution of one or more optical sources by receiving optical signals from a spatial mode sorter during multiple detection intervals. After each interval, information is processed using models representing possible source distributions, and the spatial mode sorter is configured based on that processing. The system then provides an estimated measurement of the source distribution. Processing after at least one interval includes computing an eigen-projection.

Career Highlights

Lee’s listed patent highlights work on adapting measurement procedures as optical signals are collected. The approach uses successive detection intervals and model-based processing to refine the measurement of optical sources.

Collaborations

Lee’s listed coworkers include Michael Grace and Amit Ashok. His work is associated with the University of Arizona.

Conclusion

Kwan Kit Lee’s patent focuses on adaptive, model-guided optical measurement, with the goal of estimating source distributions through successive signal processing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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