Gimcheon, South Korea

Kwan Ho Lee

This inventor holds 1 USPTO granted patent. Top assignee: Industry-Academic Cooperation Foundation Gyeongsang National University. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kwan Ho Lee. Retrieved from https://idiyas.com/inventor/kwan-ho-lee-enkihyx0

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Kwan Ho Lee: Innovator in Fracture Toughness Testing

Introduction

Kwan Ho Lee is a notable inventor based in Gimcheon-si, South Korea. He has made significant contributions to the field of materials testing, particularly in the area of fracture toughness.

Latest Patents

Kwan Ho Lee holds a patent for an innovative device titled "Anti-buckling jig for fracture toughness test." This invention is designed to enhance the accuracy of fracture toughness tests by providing a dual support system for specimens. The anti-buckling jig consists of a first jig unit that surrounds one side of the specimen and a second jig unit that surrounds the opposite side. A screw mechanism allows these two units to be coupled, ensuring that both sides of the specimen are supported simultaneously during testing. This design facilitates cracking in a single direction, improving the reliability of test results.

Career Highlights

Kwan Ho Lee is affiliated with the Industry-Academic Cooperation Foundation at Gyeongsang National University. His work at this institution emphasizes the importance of collaboration between industry and academia, fostering innovation and practical applications of research.

Collaborations

Throughout his career, Kwan Ho Lee has collaborated with esteemed colleagues, including Hyo Kyung Sung and Sang Sik Kim. These partnerships have contributed to the advancement of research and development in materials testing and related fields.

Conclusion

Kwan Ho Lee's

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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