Leverkusen, Germany

Kurt Ley

This inventor holds 1 USPTO granted patent. Top assignee: Agfa-Gevaert Ag. Active years: 1976.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kurt Ley. Retrieved from https://idiyas.com/inventor/kurt-ley-kjov5a7j

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 1976

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1 patent (USPTO):Explore Patents

Title: Kurt Ley - Innovator in Photographic Materials

Introduction

Kurt Ley is a notable inventor based in Leverkusen, Germany. He has made significant contributions to the field of photographic materials, particularly through his innovative patent.

Latest Patents

Kurt Ley holds a patent for a light-sensitive material having developers embedded therein. This photographic material features a light-sensitive silver salt emulsion layer that contains a silver salt developer of the chroman series, defined by a specific formula. His work in this area has advanced the technology used in photography.

Career Highlights

Kurt Ley is associated with Agfa-Gevaert AG, a company renowned for its expertise in imaging technology. His role at Agfa-Gevaert AG has allowed him to focus on developing cutting-edge photographic materials.

Collaborations

Kurt has collaborated with notable coworkers, including Anita Von Konig and Helmut Kampfer. Their combined efforts have contributed to advancements in the field of photographic technology.

Conclusion

Kurt Ley's innovative work in photographic materials, particularly his patented light-sensitive material, showcases his significant impact on the industry. His contributions continue to influence the development of imaging technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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