This inventor holds 1 USPTO granted patent. Top assignee: The United States of America as Represented by the Administrator. Active years: 1990.
Company Filing History:
Years Active: 1990
Title: Kurt A. Shalkhauser: Innovator in MM-Wave Integrated Circuit Testing
Introduction
Kurt A. Shalkhauser is a notable inventor based in North Olmsted, Ohio. He has made significant contributions to the field of integrated circuit testing, particularly in the development of a universal nondestructive MM-wave integrated circuit test fixture. His innovative approach has enhanced the accuracy and reliability of testing procedures in this specialized area.
Latest Patents
Kurt A. Shalkhauser holds a patent for a Universal Nondestructive MM-Wave Integrated Circuit Test Fixture. This patent describes an MMIC test fixture that includes a bias module with spring-loaded contacts, which electrically engage pads on a chip carrier. The design features RF energy application through chamfered edges of ridges in waveguide passages, ensuring effective energy transfer. Calibration standards, including 'Thru', 'Delay', and 'Short', are incorporated to maintain precision in testing. The MMIC chip is positioned within the chip carrier, allowing for movable reference planes that enhance both accuracy and flexibility.
Career Highlights
Kurt A. Shalkhauser has dedicated his career to advancing technology in the field of integrated circuits. His work has been recognized for its innovative solutions that address the challenges faced in circuit testing. He is currently associated with the United States of America as Represented by the Administrator, where he continues to contribute to technological advancements.
Collaborations
Kurt has collaborated with Robert R. Romanofsky, working together to push the boundaries of integrated circuit testing technology. Their partnership has fostered innovation and development in their respective fields.
Conclusion
Kurt A. Shalkhauser's contributions to the field of MM-wave integrated circuit testing exemplify the spirit of innovation. His patented technology not only enhances testing accuracy but also reflects his commitment to advancing the industry. His work continues to influence the future of integrated circuit testing.