Kuo-Hua Lee

Title: Innovations of Kuo-Hua Lee

Introduction

Kuo-Hua Lee is a notable inventor based in Yaoyuan County, Taiwan. He has made significant contributions to the field of memory testing technology, holding a total of 2 patents. His work focuses on enhancing the efficiency and effectiveness of memory fault detection systems.

Latest Patents

Kuo-Hua Lee's latest patents include a "Testing system and method thereof" and a "Chip testing circuit." The testing system is designed to detect various memory faults under I/O compression. It features a data pattern selection circuit, writing pattern selection units, reading pattern selection units, and a data comparison circuit. This system converts testing data into different patterns, allowing memory cells to store data accurately. The data comparison circuit then verifies if the stored data matches the expected patterns, identifying any faulty memory cells.

The chip testing circuit aims to increase testing throughput by utilizing a multiplexer to switch connections between data compressing base units. This innovation allows for a more efficient testing process by consolidating multiple data streams into a single interface circuit.

Career Highlights

Kuo-Hua Lee is currently employed at Etron Technology, Inc., where he continues to develop cutting-edge technologies in memory testing. His expertise in this area has positioned him as a key figure in the advancement of memory fault detection systems.

Collaborations

Throughout his career, Kuo-Hua Lee has collaborated with talented individuals such as Shih-Hsing Wang and Chih-Ming Cheng. These partnerships have contributed to the successful development of innovative technologies in the field.

Conclusion

Kuo-Hua Lee's contributions to memory testing technology through his patents and work at Etron Technology, Inc. highlight his importance as an inventor. His innovations continue to shape the future of memory fault detection systems.