Tochigi, Japan

Kunihiro Murata

This inventor holds 1 USPTO granted patent. Top assignee: Kao Corporation. Active years: 2001.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kunihiro Murata. Retrieved from https://idiyas.com/inventor/kunihiro-murata

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 91(Granted Patents)


Company Filing History:


Years Active: 2001

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1 patent (USPTO):Explore Patents

Title: Kunihiro Murata: Innovator in Skin Condition Evaluation

Introduction

Kunihiro Murata is a notable inventor based in Tochigi, Japan. He has made significant contributions to the field of dermatology through his innovative methods for evaluating skin conditions. His work is particularly relevant in the context of cosmetic and medical applications.

Latest Patents

Murata holds a patent for a method that evaluates skin conditions. This invention involves applying at least two chemical substances to the skin, measuring the amounts of these substances that penetrate the skin, and calculating the ratio of these amounts. This method is accompanied by a kit that includes a reagent with the chemical substances and a measuring device to facilitate the evaluation process.

Career Highlights

Kunihiro Murata is associated with Kao Corporation, a leading company in the consumer goods and cosmetics industry. His work at Kao Corporation has allowed him to focus on innovative solutions that enhance skin health and beauty.

Collaborations

Murata has collaborated with notable colleagues, including Makoto Sato and Yasushi Shioya. These collaborations have contributed to the advancement of research and development in skin evaluation technologies.

Conclusion

Kunihiro Murata's contributions to skin condition evaluation highlight the importance of innovation in dermatology. His patented methods and collaborative efforts continue to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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