Tamano, Japan

Kunihiro Mitsuhashi

This inventor holds 1 USPTO granted patent. Top assignee: Mitsui Engineering and Shipbuilding Company Limited. Active years: 1991.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kunihiro Mitsuhashi. Retrieved from https://idiyas.com/inventor/kunihiro-mitsuhashi-nf1kvm78

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 29(Granted Patents)


Company Filing History:


Years Active: 1991

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Kunihiro Mitsuhashi: Innovator in Structural Inspection Technology

Introduction

Kunihiro Mitsuhashi is a notable inventor based in Tamano, Japan. He has made significant contributions to the field of structural inspection technology. His innovative approach has led to the development of a unique method that enhances the safety and reliability of various structures.

Latest Patents

Mitsuhashi holds a patent for a "Method and apparatus for impact-type inspection of structures." This invention is crucial for ensuring the integrity of structures by providing a reliable means of inspection.

Career Highlights

He is currently employed at Mitsui Engineering and Shipbuilding Company Limited, where he continues to work on advancements in engineering and technology. His expertise in structural inspection has positioned him as a valuable asset to his company.

Collaborations

Mitsuhashi has collaborated with talented coworkers, including Fujio Oka and Chihiro Jyomuta. Their combined efforts contribute to the innovative projects at Mitsui Engineering and Shipbuilding Company Limited.

Conclusion

Kunihiro Mitsuhashi's work in structural inspection technology exemplifies the impact of innovation in engineering. His contributions are vital for enhancing safety standards in construction and engineering practices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…