Zhejiang, China

Kun Yu

This inventor holds 1 USPTO granted patent. Top assignee: Zhejiang Huadian Equipment Testing and Researching Institute Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kun Yu. Retrieved from https://idiyas.com/inventor/kun-yu-7k761vba

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Kun Yu and Computerized Simulation Validation for Full-Scale Testing.

Introduction

Kun Yu is an inventor based in Zhejiang, China. His work includes a patented method for validating full-scale distribution network single-phase-to-ground fault tests through computerized simulation.

Latest Patents

Yu’s listed patent, “Computerized Simulation Validation for Full-Scale Testing,” describes a method that simulates a full-scale test system while controlling external quantities to conform to specified conditions. It then compares internal quantities from field testing with those from simulation testing and uses the conformance-check result to validate the field test. The method is intended to improve the normalization and conformance of full-scale distribution network ground-fault testing. Related system, apparatus, and computer-readable-medium implementations are also described. The provided data lists 1 patent.

Career Highlights

Yu is associated with Zhejiang Huadian Equipment Testing and Researching Institute Co., Ltd. His listed invention focuses on applying computerized simulation to the validation of electrical distribution network testing.

Collaborations

Zhi Li and Shaofeng Yu are identified as Yu’s coworkers. The provided information does not specify their roles in the patent or the extent of their collaboration.

Conclusion

Kun Yu’s listed patent applies simulation and conformance checking to full-scale distribution network fault testing, with the goal of making test validation more consistent.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…