Kun Liu

Title: Kun Liu: Innovator in Mark Quality Inspection Technology

Introduction

Kun Liu is a notable inventor based in Changzhou, China. He has made significant contributions to the field of mark quality inspection technology. His innovative approach has led to the development of a method and apparatus that enhances the quality control processes in manufacturing.

Latest Patents

Kun Liu holds a patent for a "Mark quality inspection method and apparatus, computer device, and storage medium." This application focuses on a method that includes acquiring a marked-product image obtained by photographing a marked product after a marking operation. The process involves performing image identification on the marked-product image to determine the quality of the identification code. If the mark quality is deemed normal, a signal is output to indicate that the product can proceed to the next stage of processing. This invention aims to identify mark quality issues promptly, thereby reducing defects in mass-produced items.

Career Highlights

Throughout his career, Kun Liu has worked with prominent companies in the technology sector. He has been associated with Jiangsu Contemporary Amperex Technology Limited and Contemporary Amperex Technology Co., Ltd. His experience in these organizations has contributed to his expertise in developing innovative solutions for quality inspection.

Collaborations

Kun Liu has collaborated with talented individuals in his field, including Lei Song and Guangcheng Zhong. These partnerships have fostered a creative environment that encourages the development of cutting-edge technologies.

Conclusion

Kun Liu's contributions to mark quality inspection technology demonstrate his commitment to innovation and quality control in manufacturing. His patent reflects a significant advancement in ensuring product quality, which is essential for the success of mass production.