The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2025
Filed:
Sep. 14, 2023
Jiangsu Contemporary Amperex Technology Limited, Changzhou, CN;
Contemporary Amperex Technology Co., Limited, Ningde, CN;
JIANGSU CONTEMPORARY AMPEREX TECHNOLOGY LIMITED, Changzhou, CN;
CONTEMPORARY AMPEREX TECHNOLOGY CO, LIMITED, Ningde, CN;
Abstract
This application relates to a mark quality inspection method and apparatus, a computer device, and a storage medium. The method includes: acquiring a marked-product image obtained by photographing a marked product upon completion of a marking operation on a product; performing image identification on the marked-product image to obtain a mark quality identification result of an identification code in the marked-product image; and outputting a first indication signal under a condition that the mark quality identification result is normal, where the first indication signal is used to indicate that the marked product flows to a process subsequent to the marking operation. In embodiments of this application, mark quality problems can be found in a timely manner, reducing cases of undesirable mark quality and defectiveness of mass-produced products.