Waltham, MA, United States of America

Kumsal Deniz Sezen

This inventor holds 1 USPTO granted patent. Top assignee: L-3 Communications Security and Detection Systems Corporation. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kumsal Deniz Sezen. Retrieved from https://idiyas.com/inventor/kumsal-deniz-sezen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Kumsal Deniz Sezen: Innovator in 3D Mapping Technology

Introduction

Kumsal Deniz Sezen is a prominent inventor based in Waltham, MA (US). She has made significant contributions to the field of 3D mapping technology. Her innovative work focuses on generating location and size measurements for small scattered objects in large mediums.

Latest Patents

Kumsal holds a patent for her invention titled "3D mapping with two orthogonal imaging views." This patent encompasses methods, systems, and apparatuses, including computer programs encoded on a computer storage medium. The technology aims to enhance the accuracy and efficiency of measuring small objects within expansive environments. She has 1 patent to her name.

Career Highlights

Kumsal is currently employed at L-3 Communications Security and Detection Systems Corporation, where she applies her expertise in developing advanced security and detection systems. Her role involves collaborating with a team of skilled professionals to innovate and improve existing technologies.

Collaborations

One of her notable coworkers is Stephen Bushnell-Fowler, with whom she collaborates on various projects within the company.

Conclusion

Kumsal Deniz Sezen is a trailblazer in the realm of 3D mapping technology, and her contributions continue to shape the future of measurement systems. Her work exemplifies the impact of innovation in enhancing technological capabilities.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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